The Journal of Plant Science Research - A UGC Care-Listed Journal
Published in Association with Forum For the Promotion of Plant Science Research
Current Volume: 41 (2025 )
ISSN: 0970-2539
e-ISSN: 0976-3880
Periodicity: Tri-annual
Month(s) of Publication: April, August & December
Subject: Botany
DOI: 10.32381/JPSR
Online Access is Free for Life Member
Interrelationship and Path Analysis for Yield Improvement in Elite Rice Genotypes
By : G . Suresh Babu , L. Bandana Devi , Ravi Kumar , Satish Kumar Rai
Page No: 173-177
AbstractA study of genetic variation and inter-relationship among grain yield and its component traits in rice (Oryza sativa L.) was carried out using 40 elite rice genotypes. Maximum GCV and PCV were exhibited by biological yield, grain yield per plant and spikelets per panicle. All traits exhibited high heritability in broad sense and comprising low to high genetic advance as percent of mean coupled with high heritability. Flag leaf length, flag leaf width, tillers per hill, panicles per hill, spikelets per panicle, biological yield, harvest index, test weight and grain yield per plant exhibited high genetic advance as percent of mean. Grain yield revealed significant positive genotypic association with days to 50% flowering, flag leaf width, spikelets per panicles, days to maturity, biological yield and harvest index and while negative relationship with flag leaf width both at phenotypic and genotypic levels. Path coefficient analysis revealed that tillers per plant has highest positive direct effect followed by days to 50% flowering, biological yield per hill, harvest index, panicle length, flag leaf width, plant height and flag leaf length which indicated that these traits were more contributors to grain yield in rice.
Authors :
Ravi Kumar, G . Suresh Babu, Satish Kumar Rai and L. Bandana Devi : Experimentation Centre of Department of Genetics and Plant Breeding, Faculty of Agriculture, Sam Higginbottom Institute of Agriculture, Technology and Sciences, Allahabad-211007, U.P. India