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IAPQR Transactions - A UGC-CARE Listed Journal

Published in Association with Indian Association for Productivity, Quality and Reliability

Current Volume: 49 (2024-2025 )

ISSN: 0970-0102

Periodicity: Half-Yearly

Month(s) of Publication: September & March

Subject: Quality Management/Statistics

DOI: 10.32381/IAPQRT

100

Binomial Type Exponential Class Software Reliability Growth Model and Estimation of Parameters

By : Rajesh Singh, Kailash R. Kale, Pritee Singh

Page No: 108-122

Abstract
The total number of failures and the failure rate are the parameters to be estimated for assessing the performance of the Software. The Binomial type and exponential class software reliability growth model is considered and the Bayes estimators of the parameters are derived in this research paper. A non-informative prior for the total number of failures and gamma prior for Failure rate are assumed to obtain the Bayes estimator for the parameters. Using the Monte Carlo simulation technique, the performance of the derived Bayes estimators is studied by comparing with the corresponding maximum likelihood estimators. The proposed Bayes estimators are recommended for use with appropriate selection of prior constants.

Authors :
Rajesh Singh : 
Department of Statistics, Sant Gadge Baba Amravati University, Amravati
Kailash R. Kale : Department of Statistics, Ghulam Nabi Azad Arts, Commerce, and Science College, Barshitakli, Dist-Akola
Pritee Singh : Department of Statistics, Institute of Science, Nagpur
 

DOI: https://doi.org/10.32381/IAPQRT.2024.48.01-02.6

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