Sampling Inspection Plan For Exponentially Distributed Quality Characteristic And Beyond

By : Harsh Tripathi , Sudhansu S. Maiti , Shovan Biswas , Mahendra Saha

Page No: 157-173

Abstract
In this article, an acceptance sampling inspection plan for variable is discussed when the quality characteristic follows some non-normal distributions, viz., the exponential, Lindley, xgamma or Akash distribution. In this plan, the lot quality is to be measured by the lot mean (
). The plan parameters have been obtained by the two point approaches: the acceptable quality level (AQL) and the limiting quality level (LQL) or the rejectable quality level (RQL). For the given producer’s risk () and consumer’s risk (), the plan parameters: sample size () and acceptance number () are determined for different choices of AQL and LQL. A comparison study has been made in terms of the sample size () and an example is provided to illustrate the performance of the proposed plan

Authors :
Harsh Tripathi
Department of Statistics, Central University of Rajasthan, Rajasthan, India.

Sudhansu S. Maiti
Department of Statistics, Visva-Bharati University, Santiniketan, India.

Shovan Biswas
Department of Statistics, Visva-Bharati University, Santiniketan, India.

Mahendra Saha
Department of Statistics, Central University of Rajasthan, Rajasthan, India.

DOI: DOI-https://doi.org/10.32381/IAPQRT.2020.44.02.3